The Latest from the NanoCenter
« Back to News List
Imaging of intergrowths, defects and grain boundaries at the nanoscale
March 23, 2010
Using the aberration-corrrected JEOL 2100F electron microscope at the University of South Carolina a team of researcher from South Carolina, Delaware and Japan examined subtle structural details of complex oxides which might find use as a catalyst to convert propane to acrylic acid and acrylonitrile.
Access paper here:
Using this high-resolution microscope exquisite images of intergrowths, grain boundaries and defects of metal oxides can be obtained. This work continues a long standing collaboration between USC's Douglas A. Blom and Tom Vogt with UD's Douglas J. Buttrey and William Pyrz.
see other publications:
From left to right:
William D. Pyrz, Douglas J. Buttrey (both from the University of Delaware)
and Douglas A. Blom and Tom Vogt (University of South Carolina)