New tools to see at the nanoscale.


The University of South Carolina's Electron Microscopy Center has a JEOL JEM 2100F high resolution electron microscope with a field emission gun, a spherical aberration corrector (CEOS), electron energy loss spectroscopy (EELS), energy dispersive x-ray spectroscopy (EDX) and can be operated in a tomography and scanning transmission electron microscope (STEM) mode and has a high angle annular dark field (HAADF) detector.

This instrument is operated by Dr. Douglas Blom, who joined USC in June 2007 from Larry Allard's group at Oakridge National Laboratory.

A series of papers (see nanoimaging publications) have been written in collaboration with Doug Buttrey and Bill Pyrz from the University of Delaware.





On the data analysis side of nanoimaging a two-year old collaboration with members of the

Interdisciplinary Mathematics Institute here at the University of South Carolina is focusing on new tools

for image reconstruction. A Spiner Series book is in the works. More to come...but here is a little taste: